@ARTICLE{Xu2018-jj,
  title    = "{A deep convolutional neural network to analyze position averaged
              convergent beam electron diffraction patterns}",
  author   = "Xu, Weizong and LeBeau, J M",
  journal  = "Ultramicroscopy",
  volume   =  188,
  pages    = "59--69",
  month    =  "3~" # may,
  year     =  2018,
  eprint   = "1708.00855",
  keywords = "automation; convolutional neural networks; electron diffraction;
              machine learning; pacbed; position averaged convergent beam;LeBeau
              Group;AFOSR;Amazon",
  doi      = "10.1016/j.ultramic.2018.03.004",
  pmid     =  29554487
}

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