A deep convolutional neural network to analyze position averaged convergent beam electron diffraction patterns. Xu, W. & LeBeau, J M Ultramicroscopy, 188:59–69, 3 May, 2018. doi bibtex 2 downloads @ARTICLE{Xu2018-jj,
title = "{A deep convolutional neural network to analyze position averaged
convergent beam electron diffraction patterns}",
author = "Xu, Weizong and LeBeau, J M",
journal = "Ultramicroscopy",
volume = 188,
pages = "59--69",
month = "3~" # may,
year = 2018,
eprint = "1708.00855",
keywords = "automation; convolutional neural networks; electron diffraction;
machine learning; pacbed; position averaged convergent beam;LeBeau
Group;AFOSR;Amazon",
doi = "10.1016/j.ultramic.2018.03.004",
pmid = 29554487
}
Downloads: 2
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