Cross version defect prediction with representative data via sparse subset selection

Cross version defect prediction with representative data via sparse subset selection. Xu, Z., Li, S., Tang, Y., Luo, X., Zhang, T., Liu, J., & Xu, J. In Khomh, F., Roy, C. K., & Siegmund, J., editors, Proceedings of the 26th Conference on Program Comprehension, ICPC 2018, Gothenburg, Sweden, May 27-28, 2018, pages 132–143, 2018. ACM.

Paper doi bibtex

@inproceedings{DBLP:conf/iwpc/XuLTLZLX18,
  author       = {Zhou Xu and
                  Shuai Li and
                  Yutian Tang and
                  Xiapu Luo and
                  Tao Zhang and
                  Jin Liu and
                  Jun Xu},
  editor       = {Foutse Khomh and
                  Chanchal K. Roy and
                  Janet Siegmund},
  title        = {Cross version defect prediction with representative data via sparse
                  subset selection},
  booktitle    = {Proceedings of the 26th Conference on Program Comprehension, {ICPC}
                  2018, Gothenburg, Sweden, May 27-28, 2018},
  pages        = {132--143},
  publisher    = {{ACM}},
  year         = {2018},
  url          = {https://doi.org/10.1145/3196321.3196331},
  doi          = {10.1145/3196321.3196331},
  timestamp    = {Thu, 10 Nov 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/iwpc/XuLTLZLX18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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