Cross version defect prediction with representative data via sparse subset selection. Xu, Z., Li, S., Tang, Y., Luo, X., Zhang, T., Liu, J., & Xu, J. In Khomh, F., Roy, C. K., & Siegmund, J., editors, Proceedings of the 26th Conference on Program Comprehension, ICPC 2018, Gothenburg, Sweden, May 27-28, 2018, pages 132–143, 2018. ACM. Paper doi bibtex @inproceedings{DBLP:conf/iwpc/XuLTLZLX18,
author = {Zhou Xu and
Shuai Li and
Yutian Tang and
Xiapu Luo and
Tao Zhang and
Jin Liu and
Jun Xu},
editor = {Foutse Khomh and
Chanchal K. Roy and
Janet Siegmund},
title = {Cross version defect prediction with representative data via sparse
subset selection},
booktitle = {Proceedings of the 26th Conference on Program Comprehension, {ICPC}
2018, Gothenburg, Sweden, May 27-28, 2018},
pages = {132--143},
publisher = {{ACM}},
year = {2018},
url = {https://doi.org/10.1145/3196321.3196331},
doi = {10.1145/3196321.3196331},
timestamp = {Thu, 10 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iwpc/XuLTLZLX18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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