Cross version defect prediction with representative data via sparse subset selection. Xu, Z., Li, S., Tang, Y., Luo, X., Zhang, T., Liu, J., & Xu, J. In Khomh, F., Roy, C. K., & Siegmund, J., editors, Proceedings of the 26th Conference on Program Comprehension, ICPC 2018, Gothenburg, Sweden, May 27-28, 2018, pages 132–143, 2018. ACM.
Cross version defect prediction with representative data via sparse subset selection [link]Paper  doi  bibtex   
@inproceedings{DBLP:conf/iwpc/XuLTLZLX18,
  author       = {Zhou Xu and
                  Shuai Li and
                  Yutian Tang and
                  Xiapu Luo and
                  Tao Zhang and
                  Jin Liu and
                  Jun Xu},
  editor       = {Foutse Khomh and
                  Chanchal K. Roy and
                  Janet Siegmund},
  title        = {Cross version defect prediction with representative data via sparse
                  subset selection},
  booktitle    = {Proceedings of the 26th Conference on Program Comprehension, {ICPC}
                  2018, Gothenburg, Sweden, May 27-28, 2018},
  pages        = {132--143},
  publisher    = {{ACM}},
  year         = {2018},
  url          = {https://doi.org/10.1145/3196321.3196331},
  doi          = {10.1145/3196321.3196331},
  timestamp    = {Thu, 10 Nov 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/iwpc/XuLTLZLX18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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