Testability Prediction for Sequential Circuits Using Neural Network. Xu, S.; Waignjo, P.; Dias, P. G.; and Shi, B. In Asian Test Symposium, pages 48-, 1997. IEEE Computer Society.
Testability Prediction for Sequential Circuits Using Neural Network. [link]Link  Testability Prediction for Sequential Circuits Using Neural Network. [link]Paper  bibtex   
@inproceedings{conf/ats/XuWDS97,
  added-at = {2016-01-13T00:00:00.000+0100},
  author = {Xu, Shiyi and Waignjo, Peter and Dias, Percy G. and Shi, Bole},
  biburl = {http://www.bibsonomy.org/bibtex/2ff3f502190bae16cb30f6d2a40b77ed8/dblp},
  booktitle = {Asian Test Symposium},
  crossref = {conf/ats/1997},
  ee = {http://doi.ieeecomputersociety.org/10.1109/ATS.1997.643916},
  interhash = {3ab46595cb2942bdcb7b509d9faa0257},
  intrahash = {ff3f502190bae16cb30f6d2a40b77ed8},
  isbn = {0-8186-8209-4},
  keywords = {dblp},
  pages = {48-},
  publisher = {IEEE Computer Society},
  timestamp = {2016-01-15T11:41:19.000+0100},
  title = {Testability Prediction for Sequential Circuits Using Neural Network.},
  url = {http://dblp.uni-trier.de/db/conf/ats/ats1997.html#XuWDS97},
  year = 1997
}
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