Testability Prediction for Sequential Circuits Using Neural Network. Xu, S., Waignjo, P., Dias, P. G., & Shi, B. In Asian Test Symposium, pages 48-, 1997. IEEE Computer Society. Link Paper bibtex @inproceedings{conf/ats/XuWDS97,
added-at = {2016-01-13T00:00:00.000+0100},
author = {Xu, Shiyi and Waignjo, Peter and Dias, Percy G. and Shi, Bole},
biburl = {http://www.bibsonomy.org/bibtex/2ff3f502190bae16cb30f6d2a40b77ed8/dblp},
booktitle = {Asian Test Symposium},
crossref = {conf/ats/1997},
ee = {http://doi.ieeecomputersociety.org/10.1109/ATS.1997.643916},
interhash = {3ab46595cb2942bdcb7b509d9faa0257},
intrahash = {ff3f502190bae16cb30f6d2a40b77ed8},
isbn = {0-8186-8209-4},
keywords = {dblp},
pages = {48-},
publisher = {IEEE Computer Society},
timestamp = {2016-01-15T11:41:19.000+0100},
title = {Testability Prediction for Sequential Circuits Using Neural Network.},
url = {http://dblp.uni-trier.de/db/conf/ats/ats1997.html#XuWDS97},
year = 1997
}
Downloads: 0
{"_id":"p4vFtCYkPnKbYtL5H","bibbaseid":"xu-waignjo-dias-shi-testabilitypredictionforsequentialcircuitsusingneuralnetwork-1997","downloads":0,"creationDate":"2016-02-09T05:23:28.024Z","title":"Testability Prediction for Sequential Circuits Using Neural Network.","author_short":["Xu, S.","Waignjo, P.","Dias, P. G.","Shi, B."],"year":1997,"bibtype":"inproceedings","biburl":"http://www.bibsonomy.org/bib/author/Peter Bryner?items=1000","bibdata":{"bibtype":"inproceedings","type":"inproceedings","added-at":"2016-01-13T00:00:00.000+0100","author":[{"propositions":[],"lastnames":["Xu"],"firstnames":["Shiyi"],"suffixes":[]},{"propositions":[],"lastnames":["Waignjo"],"firstnames":["Peter"],"suffixes":[]},{"propositions":[],"lastnames":["Dias"],"firstnames":["Percy","G."],"suffixes":[]},{"propositions":[],"lastnames":["Shi"],"firstnames":["Bole"],"suffixes":[]}],"biburl":"http://www.bibsonomy.org/bibtex/2ff3f502190bae16cb30f6d2a40b77ed8/dblp","booktitle":"Asian Test Symposium","crossref":"conf/ats/1997","ee":"http://doi.ieeecomputersociety.org/10.1109/ATS.1997.643916","interhash":"3ab46595cb2942bdcb7b509d9faa0257","intrahash":"ff3f502190bae16cb30f6d2a40b77ed8","isbn":"0-8186-8209-4","keywords":"dblp","pages":"48-","publisher":"IEEE Computer Society","timestamp":"2016-01-15T11:41:19.000+0100","title":"Testability Prediction for Sequential Circuits Using Neural Network.","url":"http://dblp.uni-trier.de/db/conf/ats/ats1997.html#XuWDS97","year":"1997","bibtex":"@inproceedings{conf/ats/XuWDS97,\n added-at = {2016-01-13T00:00:00.000+0100},\n author = {Xu, Shiyi and Waignjo, Peter and Dias, Percy G. and Shi, Bole},\n biburl = {http://www.bibsonomy.org/bibtex/2ff3f502190bae16cb30f6d2a40b77ed8/dblp},\n booktitle = {Asian Test Symposium},\n crossref = {conf/ats/1997},\n ee = {http://doi.ieeecomputersociety.org/10.1109/ATS.1997.643916},\n interhash = {3ab46595cb2942bdcb7b509d9faa0257},\n intrahash = {ff3f502190bae16cb30f6d2a40b77ed8},\n isbn = {0-8186-8209-4},\n keywords = {dblp},\n pages = {48-},\n publisher = {IEEE Computer Society},\n timestamp = {2016-01-15T11:41:19.000+0100},\n title = {Testability Prediction for Sequential Circuits Using Neural Network.},\n url = {http://dblp.uni-trier.de/db/conf/ats/ats1997.html#XuWDS97},\n year = 1997\n}\n\n","author_short":["Xu, S.","Waignjo, P.","Dias, P. G.","Shi, B."],"key":"conf/ats/XuWDS97","id":"conf/ats/XuWDS97","bibbaseid":"xu-waignjo-dias-shi-testabilitypredictionforsequentialcircuitsusingneuralnetwork-1997","role":"author","urls":{"Link":"http://doi.ieeecomputersociety.org/10.1109/ATS.1997.643916","Paper":"http://dblp.uni-trier.de/db/conf/ats/ats1997.html#XuWDS97"},"keyword":["dblp"],"downloads":0},"search_terms":["testability","prediction","sequential","circuits","using","neural","network","xu","waignjo","dias","shi"],"keywords":["dblp"],"authorIDs":[],"dataSources":["R7Sibxa4rHybrdx8J"]}