Total Jitter Measurement for Testing HSIO Integrated SoCs. Yamaguchi, T. J. & Ishida, M. In ATS, pages 194, 2008. IEEE Computer Society.
Total Jitter Measurement for Testing HSIO Integrated SoCs. [link]Link  Total Jitter Measurement for Testing HSIO Integrated SoCs. [link]Paper  bibtex   
@inproceedings{conf/ats/YamaguchiI08,
  added-at = {2016-02-01T00:00:00.000+0100},
  author = {Yamaguchi, Takahiro J. and Ishida, Masahiro},
  biburl = {http://www.bibsonomy.org/bibtex/201f18bf3e18d7ac8867583b3e71ade01/dblp},
  booktitle = {ATS},
  crossref = {conf/ats/2008},
  ee = {http://doi.ieeecomputersociety.org/10.1109/ATS.2008.38},
  interhash = {4fd3e00f64d55b56bebac148873948b9},
  intrahash = {01f18bf3e18d7ac8867583b3e71ade01},
  isbn = {978-0-7695-3396-4},
  keywords = {dblp},
  pages = 194,
  publisher = {IEEE Computer Society},
  timestamp = {2016-02-03T11:43:51.000+0100},
  title = {Total Jitter Measurement for Testing HSIO Integrated SoCs.},
  url = {http://dblp.uni-trier.de/db/conf/ats/ats2008.html#YamaguchiI08},
  year = 2008
}

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