A Robust -40 to 120°C All-Digital True Random Number Generator in 40nm CMOS. Yang, K., Blaauw, D., & Sylvester, D. In 2015 Symposium on VLSI Circuits Digest of Technical Papers, pages 248–249, June, 2015. bibtex @inproceedings{yang_robust_2015,
title = {A {Robust} -40 to 120°{C} {All}-{Digital} {True} {Random} {Number} {Generator} in 40nm {CMOS}},
booktitle = {2015 {Symposium} on {VLSI} {Circuits} {Digest} of {Technical} {Papers}},
author = {Yang, Kaiyuan and Blaauw, David and Sylvester, Dennis},
month = jun,
year = {2015},
pages = {248--249}
}
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