A 23Mb/s 23pJ/b fully synthesized true-random-number generator in 28nm and 65nm CMOS. Yang, K., Fick, D., Henry, M., Lee, Y., Blaauw, D., & Sylvester, D. In 2014 IEEE International Solid-State Circuits Conference (ISSCC), pages 280–281, February, 2014. doi abstract bibtex True random number generators (TRNGs) use physical randomness as entropy sources and are heavily used in cryptography and security [1]. Although hardware TRNGs provide excellent randomness, power consumption and design complexity are often high. Previous work has demonstrated TRNGs based on a resistor-amplifier-ADC chain [2], oscillator jitter [1], metastability [3-5] and other device noise [6-7]. However, analog designs suffer from variation and noise, making them difficult to integrate with digital circuits. Recent metastability-based methods [3-5] provide excellent performance but often require careful calibration to remove bias. SiN MOSFETs [6] exploit larger thermal noise but require post-processing to achieve sufficient randomness. An oxide breakdown-based TRNG [7] shows high entropy but suffers from low performance and high energy/bit. Ring oscillator (RO)-based TRNGs offer the advantage of design simplicity, but previous methods using a slow jittery clock to sample a fast clock provide low randomness [1] and are vulnerable to power supply attacks [8]. In addition, the majority of previous methods cannot pass all NIST randomness tests.
@inproceedings{yang_23mb/s_2014,
title = {A 23Mb/s 23pJ/b fully synthesized true-random-number generator in 28nm and 65nm {CMOS}},
doi = {10.1109/isscc.2014.6757434},
abstract = {True random number generators (TRNGs) use physical randomness as entropy sources and are heavily used in cryptography and security [1]. Although hardware TRNGs provide excellent randomness, power consumption and design complexity are often high. Previous work has demonstrated TRNGs based on a resistor-amplifier-ADC chain [2], oscillator jitter [1], metastability [3-5] and other device noise [6-7]. However, analog designs suffer from variation and noise, making them difficult to integrate with digital circuits. Recent metastability-based methods [3-5] provide excellent performance but often require careful calibration to remove bias. SiN MOSFETs [6] exploit larger thermal noise but require post-processing to achieve sufficient randomness. An oxide breakdown-based TRNG [7] shows high entropy but suffers from low performance and high energy/bit. Ring oscillator (RO)-based TRNGs offer the advantage of design simplicity, but previous methods using a slow jittery clock to sample a fast clock provide low randomness [1] and are vulnerable to power supply attacks [8]. In addition, the majority of previous methods cannot pass all NIST randomness tests.},
booktitle = {2014 {IEEE} {International} {Solid}-{State} {Circuits} {Conference} ({ISSCC})},
author = {Yang, Kaiyuan and Fick, D. and Henry, M.B. and Lee, Y. and Blaauw, D. and Sylvester, D.},
month = feb,
year = {2014},
pages = {280--281}
}
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{"_id":"LJNzvGecQmfvDEc6S","bibbaseid":"yang-fick-henry-lee-blaauw-sylvester-a23mbs23pjbfullysynthesizedtruerandomnumbergeneratorin28nmand65nmcmos-2014","authorIDs":[],"author_short":["Yang, K.","Fick, D.","Henry, M.","Lee, Y.","Blaauw, D.","Sylvester, D."],"bibdata":{"bibtype":"inproceedings","type":"inproceedings","title":"A 23Mb/s 23pJ/b fully synthesized true-random-number generator in 28nm and 65nm CMOS","doi":"10.1109/isscc.2014.6757434","abstract":"True random number generators (TRNGs) use physical randomness as entropy sources and are heavily used in cryptography and security [1]. Although hardware TRNGs provide excellent randomness, power consumption and design complexity are often high. Previous work has demonstrated TRNGs based on a resistor-amplifier-ADC chain [2], oscillator jitter [1], metastability [3-5] and other device noise [6-7]. However, analog designs suffer from variation and noise, making them difficult to integrate with digital circuits. Recent metastability-based methods [3-5] provide excellent performance but often require careful calibration to remove bias. SiN MOSFETs [6] exploit larger thermal noise but require post-processing to achieve sufficient randomness. An oxide breakdown-based TRNG [7] shows high entropy but suffers from low performance and high energy/bit. Ring oscillator (RO)-based TRNGs offer the advantage of design simplicity, but previous methods using a slow jittery clock to sample a fast clock provide low randomness [1] and are vulnerable to power supply attacks [8]. In addition, the majority of previous methods cannot pass all NIST randomness tests.","booktitle":"2014 IEEE International Solid-State Circuits Conference (ISSCC)","author":[{"propositions":[],"lastnames":["Yang"],"firstnames":["Kaiyuan"],"suffixes":[]},{"propositions":[],"lastnames":["Fick"],"firstnames":["D."],"suffixes":[]},{"propositions":[],"lastnames":["Henry"],"firstnames":["M.B."],"suffixes":[]},{"propositions":[],"lastnames":["Lee"],"firstnames":["Y."],"suffixes":[]},{"propositions":[],"lastnames":["Blaauw"],"firstnames":["D."],"suffixes":[]},{"propositions":[],"lastnames":["Sylvester"],"firstnames":["D."],"suffixes":[]}],"month":"February","year":"2014","pages":"280–281","bibtex":"@inproceedings{yang_23mb/s_2014,\n\ttitle = {A 23Mb/s 23pJ/b fully synthesized true-random-number generator in 28nm and 65nm {CMOS}},\n\tdoi = {10.1109/isscc.2014.6757434},\n\tabstract = {True random number generators (TRNGs) use physical randomness as entropy sources and are heavily used in cryptography and security [1]. Although hardware TRNGs provide excellent randomness, power consumption and design complexity are often high. Previous work has demonstrated TRNGs based on a resistor-amplifier-ADC chain [2], oscillator jitter [1], metastability [3-5] and other device noise [6-7]. However, analog designs suffer from variation and noise, making them difficult to integrate with digital circuits. Recent metastability-based methods [3-5] provide excellent performance but often require careful calibration to remove bias. SiN MOSFETs [6] exploit larger thermal noise but require post-processing to achieve sufficient randomness. An oxide breakdown-based TRNG [7] shows high entropy but suffers from low performance and high energy/bit. Ring oscillator (RO)-based TRNGs offer the advantage of design simplicity, but previous methods using a slow jittery clock to sample a fast clock provide low randomness [1] and are vulnerable to power supply attacks [8]. In addition, the majority of previous methods cannot pass all NIST randomness tests.},\n\tbooktitle = {2014 {IEEE} {International} {Solid}-{State} {Circuits} {Conference} ({ISSCC})},\n\tauthor = {Yang, Kaiyuan and Fick, D. and Henry, M.B. and Lee, Y. and Blaauw, D. and Sylvester, D.},\n\tmonth = feb,\n\tyear = {2014},\n\tpages = {280--281}\n}\n\n","author_short":["Yang, K.","Fick, D.","Henry, M.","Lee, Y.","Blaauw, D.","Sylvester, D."],"key":"yang_23mb/s_2014","id":"yang_23mb/s_2014","bibbaseid":"yang-fick-henry-lee-blaauw-sylvester-a23mbs23pjbfullysynthesizedtruerandomnumbergeneratorin28nmand65nmcmos-2014","role":"author","urls":{},"downloads":0},"bibtype":"inproceedings","biburl":"https://bibbase.org/zotero/ky25","creationDate":"2019-05-11T17:47:04.305Z","downloads":0,"keywords":[],"search_terms":["23mb","23pj","fully","synthesized","true","random","number","generator","28nm","65nm","cmos","yang","fick","henry","lee","blaauw","sylvester"],"title":"A 23Mb/s 23pJ/b fully synthesized true-random-number generator in 28nm and 65nm CMOS","year":2014,"dataSources":["XxiQtwZYfozhQmvGR"]}