Layout Hotspot Detection With Feature Tensor Generation and Deep Biased Learning. Yang, H., Su, J., Zou, Y., Ma, Y., Yu, B., & Young, E. F. Y. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 38(6):1175–1187, June, 2019. ![Layout Hotspot Detection With Feature Tensor Generation and Deep Biased Learning [link]](https://bibbase.org/img/filetypes/link.svg "link")
Paper doi bibtex @article{yang_layout_2019,
title = {Layout {Hotspot} {Detection} {With} {Feature} {Tensor} {Generation} and {Deep} {Biased} {Learning}},
volume = {38},
issn = {0278-0070, 1937-4151},
url = {https://ieeexplore.ieee.org/document/8360060/},
doi = {10.1109/TCAD.2018.2837078},
number = {6},
urldate = {2020-02-28},
journal = {IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems},
author = {Yang, Haoyu and Su, Jing and Zou, Yi and Ma, Yuzhe and Yu, Bei and Young, Evangeline F. Y.},
month = jun,
year = {2019},
keywords = {\#broken, Feature extraction, Integrated circuit modeling, Jab/\#TCDICS, Layout, Machine learning, Neural networks, Tensile stress, Training},
pages = {1175--1187},
}
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