@article{ Yankovich2014,
  author = {Yankovich, A.B.a  and Berkels, B.b  c  and Dahmen, W.b  d  and Binev, P.b  and Sanchez, S.I.e  and Bradley, S.A.e  and Li, A.a  and Szlufarska, I.a  and Voyles, P.M.a },
  title = {Picometre-precision analysis of scanning transmission electron microscopy images of platinum nanocatalysts},
  journal = {Nature Communications},
  year = {2014},
  volume = {5},
  doi = {10.1038/ncomms5155},
  art_number = {4155},
  note = {cited By 3},
  url = {http://www.scopus.com/inward/record.url?eid=2-s2.0-84902352354&partnerID=40&md5=37d21207707c43302baa50cc759b5883},
  affiliation = {Department of Materials Science and Engineering, University of Wisconsin - Madison, Madison, WI 53706, United States; Interdisciplinary Mathematics Institute, University of South Carolina, Columbia, SC 29208, United States; Aachen Institute for Advanced Study in Computational Engineering Science (AICES), RWTH Aachen, Schinkelstrasse 2, Aachen 52062, Germany; Institut für Geometrie und Praktische Mathematik, RWTH Aachen, Templergraben 55, Aachen 52056, Germany; UOP LLC A Honeywell Company, Des Plaines, IL 60017, United States},
  abstract = {Measuring picometre-scale shifts in the positions of individual atoms in materials provides new insight into the structure of surfaces, defects and interfaces that influence a broad variety of materials' behaviour. Here we demonstrate sub-picometre precision measurements of atom positions in aberration-corrected Z-contrast scanning transmission electron microscopy images based on the non-rigid registration and averaging of an image series. Non-rigid registration achieves five to seven times better precision than previous methods. Non-rigidly registered images of a silica-supported platinum nanocatalyst show pm-scale contraction of atoms at a (111)/(111) corner towards the particle centre and expansion of a flat (111) facet. Sub-picometre precision and standardless atom counting with <1 atom uncertainty in the same scanning transmission electron microscopy image provide new insight into the three-dimensional atomic structure of catalyst nanoparticle surfaces, which contain the active sites controlling catalytic reactions. © 2014 Macmillan Publishers Limited. All rights reserved.},
  document_type = {Article},
  source = {Scopus}
}

{"_id":"hgAjcu5WH4HpHLn5S","authorIDs":[],"author_short":["Yankovich, A.","Berkels","c, B.","Dahmen","d, W.","Binev, P.","Sanchez, S.","Bradley, S.","Li, A.","Szlufarska, I.","Voyles, P."],"bibbaseid":"yankovich-berkels-c-dahmen-d-binev-sanchez-bradley-li-szlufarska-voyles-picometreprecisionanalysisofscanningtransmissionelectronmicroscopyimagesofplatinumnanocatalysts-2014","bibdata":{"abstract":"Measuring picometre-scale shifts in the positions of individual atoms in materials provides new insight into the structure of surfaces, defects and interfaces that influence a broad variety of materials' behaviour. Here we demonstrate sub-picometre precision measurements of atom positions in aberration-corrected Z-contrast scanning transmission electron microscopy images based on the non-rigid registration and averaging of an image series. Non-rigid registration achieves five to seven times better precision than previous methods. Non-rigidly registered images of a silica-supported platinum nanocatalyst show pm-scale contraction of atoms at a (111)/(111) corner towards the particle centre and expansion of a flat (111) facet. Sub-picometre precision and standardless atom counting with <1 atom uncertainty in the same scanning transmission electron microscopy image provide new insight into the three-dimensional atomic structure of catalyst nanoparticle surfaces, which contain the active sites controlling catalytic reactions. © 2014 Macmillan Publishers Limited. All rights reserved.","affiliation":"Department of Materials Science and Engineering, University of Wisconsin - Madison, Madison, WI 53706, United States; Interdisciplinary Mathematics Institute, University of South Carolina, Columbia, SC 29208, United States; Aachen Institute for Advanced Study in Computational Engineering Science (AICES), RWTH Aachen, Schinkelstrasse 2, Aachen 52062, Germany; Institut für Geometrie und Praktische Mathematik, RWTH Aachen, Templergraben 55, Aachen 52056, Germany; UOP LLC A Honeywell Company, Des Plaines, IL 60017, United States","art_number":"4155","author":["Yankovich, A.B.a","Berkels","c, B.b","Dahmen","d, W.b","Binev, P.b","Sanchez, S.I.e","Bradley, S.A.e","Li, A.a","Szlufarska, I.a","Voyles, P.M.a"],"author_short":["Yankovich, A.","Berkels","c, B.","Dahmen","d, W.","Binev, P.","Sanchez, S.","Bradley, S.","Li, A.","Szlufarska, I.","Voyles, P."],"bibtex":"@article{ Yankovich2014,\n author = {Yankovich, A.B.a and Berkels, B.b c and Dahmen, W.b d and Binev, P.b and Sanchez, S.I.e and Bradley, S.A.e and Li, A.a and Szlufarska, I.a and Voyles, P.M.a },\n title = {Picometre-precision analysis of scanning transmission electron microscopy images of platinum nanocatalysts},\n journal = {Nature Communications},\n year = {2014},\n volume = {5},\n doi = {10.1038/ncomms5155},\n art_number = {4155},\n note = {cited By 3},\n url = {http://www.scopus.com/inward/record.url?eid=2-s2.0-84902352354&partnerID=40&md5=37d21207707c43302baa50cc759b5883},\n affiliation = {Department of Materials Science and Engineering, University of Wisconsin - Madison, Madison, WI 53706, United States; Interdisciplinary Mathematics Institute, University of South Carolina, Columbia, SC 29208, United States; Aachen Institute for Advanced Study in Computational Engineering Science (AICES), RWTH Aachen, Schinkelstrasse 2, Aachen 52062, Germany; Institut für Geometrie und Praktische Mathematik, RWTH Aachen, Templergraben 55, Aachen 52056, Germany; UOP LLC A Honeywell Company, Des Plaines, IL 60017, United States},\n abstract = {Measuring picometre-scale shifts in the positions of individual atoms in materials provides new insight into the structure of surfaces, defects and interfaces that influence a broad variety of materials' behaviour. Here we demonstrate sub-picometre precision measurements of atom positions in aberration-corrected Z-contrast scanning transmission electron microscopy images based on the non-rigid registration and averaging of an image series. Non-rigid registration achieves five to seven times better precision than previous methods. Non-rigidly registered images of a silica-supported platinum nanocatalyst show pm-scale contraction of atoms at a (111)/(111) corner towards the particle centre and expansion of a flat (111) facet. Sub-picometre precision and standardless atom counting with <1 atom uncertainty in the same scanning transmission electron microscopy image provide new insight into the three-dimensional atomic structure of catalyst nanoparticle surfaces, which contain the active sites controlling catalytic reactions. © 2014 Macmillan Publishers Limited. All rights reserved.},\n document_type = {Article},\n source = {Scopus}\n}","bibtype":"article","document_type":"Article","doi":"10.1038/ncomms5155","id":"Yankovich2014","journal":"Nature Communications","key":"Yankovich2014","note":"cited By 3","source":"Scopus","title":"Picometre-precision analysis of scanning transmission electron microscopy images of platinum nanocatalysts","type":"article","url":"http://www.scopus.com/inward/record.url?eid=2-s2.0-84902352354&partnerID=40&md5=37d21207707c43302baa50cc759b5883","volume":"5","year":"2014","bibbaseid":"yankovich-berkels-c-dahmen-d-binev-sanchez-bradley-li-szlufarska-voyles-picometreprecisionanalysisofscanningtransmissionelectronmicroscopyimagesofplatinumnanocatalysts-2014","role":"author","urls":{"Paper":"http://www.scopus.com/inward/record.url?eid=2-s2.0-84902352354&partnerID=40&md5=37d21207707c43302baa50cc759b5883"},"downloads":0},"bibtype":"article","biburl":"https://dl.dropboxusercontent.com/u/15029660/qsoTheory.bib","creationDate":"2015-04-20T04:34:56.352Z","downloads":0,"keywords":[],"search_terms":["picometre","precision","analysis","scanning","transmission","electron","microscopy","images","platinum","nanocatalysts","yankovich","berkels","c","dahmen","d","binev","sanchez","bradley","li","szlufarska","voyles"],"title":"Picometre-precision analysis of scanning transmission electron microscopy images of platinum nanocatalysts","year":2014,"dataSources":["Kn9Y9q8Ac6KSgZtN8"]}