In situ electron holography study of charge distribution in high-κ charge-trapping memory

In situ electron holography study of charge distribution in high-κ charge-trapping memory. Yao, Y., Li, C., Huo, Z. L., Liu, M., Zhu, C. X., Gu, C. Z., Duan, X. F., Wang, Y. G., Gu, L., & Yu, R. C. Nature Communications, 4:2764, November, 2013.

Paper doi abstract bibtex

\textlessp\textgreater Charge-trapping memory offers many advantages over existing data storage media, though the spatial distribution of charge remains elusive. Here Yao et al. use electron holography to map its distribution in high-κ dielectric stacks under different applied bias.\textless/p\textgreater

@article{yao_situ_2013,
	title = {\textit{{In} situ} electron holography study of charge distribution in high-\textit{κ} charge-trapping memory},
	volume = {4},
	copyright = {2013 Nature Publishing Group},
	issn = {2041-1723},
	url = {https://www.nature.com/articles/ncomms3764},
	doi = {10.1038/ncomms3764},
	abstract = {{\textless}p{\textgreater}
Charge-trapping memory offers many advantages over existing data storage media, though the spatial distribution of charge remains elusive. Here Yao \textit{et al}. use electron holography to map its distribution in high-κ dielectric stacks under different applied bias.{\textless}/p{\textgreater}},
	language = {En},
	urldate = {2017-12-13},
	journal = {Nature Communications},
	author = {Yao, Y. and Li, C. and Huo, Z. L. and Liu, M. and Zhu, C. X. and Gu, C. Z. and Duan, X. F. and Wang, Y. G. and Gu, L. and Yu, R. C.},
	month = nov,
	year = {2013},
	pages = {2764},
}

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