@inproceedings{DBLP:conf/aspdac/Ye0WKX24,
  author       = {Min Ye and
                  Qiao Li and
                  Daniel Wen and
                  Tei{-}Wei Kuo and
                  Chun Jason Xue},
  title        = {wearMeter: an Accurate Wear Metric for {NAND} Flash Memory},
  booktitle    = {Proceedings of the 29th Asia and South Pacific Design Automation Conference,
                  {ASPDAC} 2024, Incheon, Korea, January 22-25, 2024},
  pages        = {442--447},
  publisher    = {{IEEE}},
  year         = {2024},
  url          = {https://doi.org/10.1109/ASP-DAC58780.2024.10473972},
  doi          = {10.1109/ASP-DAC58780.2024.10473972},
  timestamp    = {Fri, 04 Jul 2025 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/aspdac/Ye0WKX24.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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