@inproceedings{DBLP:conf/dsn/YimKI10,
  author    = {Keun Soo Yim and
               Zbigniew Kalbarczyk and
               Ravishankar K. Iyer},
  title     = {Measurement-based analysis of fault and error sensitivities of dynamic
               memory},
  booktitle = {Proceedings of the 2010 {IEEE/IFIP} International Conference on Dependable
               Systems and Networks, {DSN} 2010, Chicago, IL, USA, June 28 - July
               1 2010},
  pages     = {431--436},
  year      = {2010},
  crossref  = {DBLP:conf/dsn/2010},
  url       = {https://doi.org/10.1109/DSN.2010.5544287},
  doi       = {10.1109/DSN.2010.5544287},
  timestamp = {Sun, 21 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/dsn/YimKI10},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

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