Measurement-based analysis of fault and error sensitivities of dynamic memory. Yim, K. S., Kalbarczyk, Z., & Iyer, R. K. In Proceedings of the 2010 IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2010, Chicago, IL, USA, June 28 - July 1 2010, pages 431–436, 2010.
Paper doi bibtex @inproceedings{DBLP:conf/dsn/YimKI10,
author = {Keun Soo Yim and
Zbigniew Kalbarczyk and
Ravishankar K. Iyer},
title = {Measurement-based analysis of fault and error sensitivities of dynamic
memory},
booktitle = {Proceedings of the 2010 {IEEE/IFIP} International Conference on Dependable
Systems and Networks, {DSN} 2010, Chicago, IL, USA, June 28 - July
1 2010},
pages = {431--436},
year = {2010},
crossref = {DBLP:conf/dsn/2010},
url = {https://doi.org/10.1109/DSN.2010.5544287},
doi = {10.1109/DSN.2010.5544287},
timestamp = {Sun, 21 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/bib/conf/dsn/YimKI10},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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