Enhanced Measurement Model for Subspace-Based Tracking. Yin, S., Joo Yoo, H., & Young Choi, J. In Proceedings of International Conference on Pattern Recognition (ICPR), pages 3492-3495, 2010.
Enhanced Measurement Model for Subspace-Based Tracking [link]Paper  bibtex   
@inproceedings{ dblp2958172,
  title = {Enhanced Measurement Model for Subspace-Based Tracking},
  author = {Shimin Yin and Haan Joo Yoo and Jin Young Choi},
  author_short = {Yin, S. and Joo Yoo, H. and Young Choi, J.},
  bibtype = {inproceedings},
  type = {inproceedings},
  year = {2010},
  key = {dblp2958172},
  id = {dblp2958172},
  biburl = {http://www.dblp.org/rec/bibtex/conf/icpr/YinYC10},
  url = {http://dx.doi.org/10.1109/ICPR.2010.852},
  conference = {ICPR},
  pages = {3492-3495},
  text = {ICPR 2010:3492-3495},
  booktitle = {Proceedings of International Conference on Pattern Recognition (ICPR)}
}

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