Application of Elliptic Fourier Descriptors to Symmetry Detection Under Parallel Projection. Yip, R. K. K., Tam, P. K., & Leung, D. N. K. IEEE Trans. Pattern Anal. Mach. Intell., 16(3):277-286, 1994.
Application of Elliptic Fourier Descriptors to Symmetry Detection Under Parallel Projection. [link]Link  Application of Elliptic Fourier Descriptors to Symmetry Detection Under Parallel Projection. [link]Paper  bibtex   
@article{journals/pami/YipTL94,
  added-at = {2016-03-12T00:00:00.000+0100},
  author = {Yip, Raymond K. K. and Tam, Peter Kwong-Shun and Leung, Dennis N. K.},
  biburl = {http://www.bibsonomy.org/bibtex/2e5997ac56ce18ede36ceb72a424ce095/dblp},
  ee = {http://doi.ieeecomputersociety.org/10.1109/34.276127},
  interhash = {ac8ebb23122bbef589c79b7fe1df4c1d},
  intrahash = {e5997ac56ce18ede36ceb72a424ce095},
  journal = {IEEE Trans. Pattern Anal. Mach. Intell.},
  keywords = {dblp},
  number = 3,
  pages = {277-286},
  timestamp = {2016-03-15T12:01:09.000+0100},
  title = {Application of Elliptic Fourier Descriptors to Symmetry Detection Under Parallel Projection.},
  url = {http://dblp.uni-trier.de/db/journals/pami/pami16.html#YipTL94},
  volume = 16,
  year = 1994
}

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