Application of Elliptic Fourier Descriptors to Symmetry Detection Under Parallel Projection. Yip, R. K. K., Tam, P. K., & Leung, D. N. K. IEEE Trans. Pattern Anal. Mach. Intell., 16(3):277-286, 1994. Link Paper bibtex @article{journals/pami/YipTL94,
added-at = {2016-03-12T00:00:00.000+0100},
author = {Yip, Raymond K. K. and Tam, Peter Kwong-Shun and Leung, Dennis N. K.},
biburl = {http://www.bibsonomy.org/bibtex/2e5997ac56ce18ede36ceb72a424ce095/dblp},
ee = {http://doi.ieeecomputersociety.org/10.1109/34.276127},
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journal = {IEEE Trans. Pattern Anal. Mach. Intell.},
keywords = {dblp},
number = 3,
pages = {277-286},
timestamp = {2016-03-15T12:01:09.000+0100},
title = {Application of Elliptic Fourier Descriptors to Symmetry Detection Under Parallel Projection.},
url = {http://dblp.uni-trier.de/db/journals/pami/pami16.html#YipTL94},
volume = 16,
year = 1994
}
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