@inproceedings{conf/icst/YuC15,
  added-at = {2015-05-12T00:00:00.000+0200},
  author = {Yu, Tingting and Cohen, Myra B.},
  biburl = {http://www.bibsonomy.org/bibtex/2cb3cc5dfc1e07c30e00670c31c33075a/dblp},
  booktitle = {ICST},
  crossref = {conf/icst/2015},
  ee = {http://dx.doi.org/10.1109/ICST.2015.7102592},
  interhash = {014eb8f6002095a4d27a994b6f38612b},
  intrahash = {cb3cc5dfc1e07c30e00670c31c33075a},
  isbn = {978-1-4799-7125-1},
  keywords = {dblp},
  pages = {1-10},
  publisher = {IEEE},
  timestamp = {2015-06-19T17:50:52.000+0200},
  title = {Guided Test Generation for Finding Worst-Case Stack Usage in Embedded Systems.},
  url = {http://dblp.uni-trier.de/db/conf/icst/icst2015.html#YuC15},
  year = 2015
}

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