The influence of oxygen deficiency on the thermoelectric properties of strontium titanates. Yu, C., Scullin, M. L., Huijben, M., Ramesh, R., & Majumdar, A. Applied Physics Letters, 92:092118, 2008/03/03, 2008.
The influence of oxygen deficiency on the thermoelectric properties of strontium titanates [link]Paper  abstract   bibtex   
We report oxygen reduction in bulk strontium titanate substrates when a thin film was deposited in an oxygen-deficient environment. The oxygen diffusion occurred at moderate temperatures and oxygen pressures, which were not enough to produce detectable oxygen vacancies without the film deposition. In order to identify the reduction, we used a series of different annealing conditions and various substrates and performed comparative studies regarding thermoelectricproperties before and after removing the films. Our experimental results suggest that the measurements of material properties of thin films on Sr Ti O 3 single crystal substrates need to be performed carefully due to its strong susceptibility to oxygen deficient conditions.
@article {571,
	title = {The influence of oxygen deficiency on the thermoelectric properties of strontium titanates},
	journal = {Applied Physics Letters},
	volume = {92},
	year = {2008},
	month = {2008/03/03},
	pages = {092118},
	abstract = {We report oxygen reduction in bulk strontium titanate substrates when a thin film was deposited in an oxygen-deficient environment. The oxygen diffusion occurred at moderate temperatures and oxygen pressures, which were not enough to produce detectable oxygen vacancies without the film deposition. In order to identify the reduction, we used a series of different annealing conditions and various substrates and performed comparative studies regarding thermoelectricproperties before and after removing the films. Our experimental results suggest that the measurements of material properties of thin films on Sr Ti O 3 single crystal substrates need to be performed carefully due to its strong susceptibility to oxygen deficient conditions.},
	keywords = {Annealing, Electrical resistivity, Ozone, Thin film deposition, Thin films},
	isbn = {0003-6951, 1077-3118},
	url = {http://scitation.aip.org/content/aip/journal/apl/92/9/10.1063/1.2890493},
	author = {Yu, Choongho and Scullin, Matthew L. and Huijben, Mark and Ramesh, Ramamoorthy and Majumdar, Arun}
}

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