15. Yue, Y., Feng, L., Benner, P., Pulch, R., & Schöps, S. Volume 29, ter Maten, E. J. W., Brachtendorf, H., Pulch, R., Schoenmaker, W., & De Gersem, H., editors. Reduced Models and Uncertainty Quantification, pages 329–346. Springer, Cham, November, 2019.
doi  bibtex   
@InBook{          Yue_2019aa,
  address       = {Cham},
  author        = {Yue, Yao and Feng, Lihong and Benner, Peter and Pulch, Roland and Schöps, Sebastian},
  booktitle     = {Nanoelectronic Coupled Problems Solutions},
  chapter       = {15},
  doi           = {10.1007/978-3-030-30726-4_15},
  editor        = {ter Maten, E. Jan W. and Brachtendorf, Hans-Georg and Pulch, Roland and Schoenmaker, Wim and De Gersem, Herbert},
  file          = {ter-Maten_2019aa.pdf},
  group         = {nanocops,degersem,casper,degersem,schoeps},
  isbn          = {978-3-030-30725-7},
  langid        = {english},
  month         = nov,
  pages         = {329--346},
  publisher     = {Springer},
  series        = {Mathematics in Industry},
  title         = {Reduced Models and Uncertainty Quantification},
  volume        = {29},
  year          = {2019}
}

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