15. Yue, Y., Feng, L., Benner, P., Pulch, R., & Schöps, S. Volume 29, ter Maten, E. J. W., Brachtendorf, H., Pulch, R., Schoenmaker, W., & De Gersem, H., editors. Reduced Models and Uncertainty Quantification, pages 329–346. Springer, Cham, November, 2019. doi bibtex @InBook{ Yue_2019aa,
address = {Cham},
author = {Yue, Yao and Feng, Lihong and Benner, Peter and Pulch, Roland and Schöps, Sebastian},
booktitle = {Nanoelectronic Coupled Problems Solutions},
chapter = {15},
doi = {10.1007/978-3-030-30726-4_15},
editor = {ter Maten, E. Jan W. and Brachtendorf, Hans-Georg and Pulch, Roland and Schoenmaker, Wim and De Gersem, Herbert},
file = {ter-Maten_2019aa.pdf},
group = {nanocops,degersem,casper,degersem,schoeps},
isbn = {978-3-030-30725-7},
langid = {english},
month = nov,
pages = {329--346},
publisher = {Springer},
series = {Mathematics in Industry},
title = {Reduced Models and Uncertainty Quantification},
volume = {29},
year = {2019}
}
Downloads: 0
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