Achieving reliability in OEM/ODM CPE products. Yue, C. W., Jie, Y., & Yuan, J. W. Bell Labs Technical Journal, 11(1):209-213, 2006.
Link
Paper bibtex @article{journals/bell/YueJY06,
added-at = {2006-12-12T00:00:00.000+0100},
author = {Yue, Chen Wen and Jie, Yu and Yuan, Jiang Wen},
biburl = {https://www.bibsonomy.org/bibtex/2d8fb1108eeb085d0c751c74ffad980c9/dblp},
date = {2006-12-12},
description = {dblp},
ee = {http://dx.doi.org/10.1002/bltj.20155},
interhash = {b1541cdf7cbc9932063f0db0a1a69b0d},
intrahash = {d8fb1108eeb085d0c751c74ffad980c9},
journal = {Bell Labs Technical Journal},
keywords = {dblp},
number = 1,
pages = {209-213},
timestamp = {2006-12-12T00:00:00.000+0100},
title = {Achieving reliability in OEM/ODM CPE products.},
url = {http://dblp.uni-trier.de/db/journals/bell/bell11.html#YueJY06},
volume = 11,
year = 2006
}