@article{journals/mr/YunKSSK18,
  added-at = {2019-01-07T00:00:00.000+0100},
  author = {Yun, Yeohyeok and Kim, Gang-Jun and Seo, Ji-Hoon and Son, Donghee and Kang, Bongkoo},
  biburl = {https://www.bibsonomy.org/bibtex/2c929894b601b55a91d308ca16f5385f2/dblp},
  ee = {https://doi.org/10.1016/j.microrel.2018.07.056},
  interhash = {0879d6ab00f2b52d669950e123b7a26f},
  intrahash = {c929894b601b55a91d308ca16f5385f2},
  journal = {Microelectronics Reliability},
  keywords = {dblp},
  pages = {191-195},
  timestamp = {2019-01-08T11:37:57.000+0100},
  title = {Method to extract parameters of power law for nano-scale SiON pMOSFETs under negative bias temperature instability.},
  url = {http://dblp.uni-trier.de/db/journals/mr/mr88.html#YunKSSK18},
  volume = {88-90},
  year = 2018
}

{"_id":"F5p5otKhJBbFkwwzY","bibbaseid":"yun-kim-seo-son-kang-methodtoextractparametersofpowerlawfornanoscalesionpmosfetsundernegativebiastemperatureinstability-2018","downloads":0,"creationDate":"2019-02-01T01:48:28.854Z","title":"Method to extract parameters of power law for nano-scale SiON pMOSFETs under negative bias temperature instability.","author_short":["Yun, Y.","Kim, G.","Seo, J.","Son, D.","Kang, B."],"year":2018,"bibtype":"article","biburl":"http://www.bibsonomy.org/bib/author/kim?items=1000","bibdata":{"bibtype":"article","type":"article","added-at":"2019-01-07T00:00:00.000+0100","author":[{"propositions":[],"lastnames":["Yun"],"firstnames":["Yeohyeok"],"suffixes":[]},{"propositions":[],"lastnames":["Kim"],"firstnames":["Gang-Jun"],"suffixes":[]},{"propositions":[],"lastnames":["Seo"],"firstnames":["Ji-Hoon"],"suffixes":[]},{"propositions":[],"lastnames":["Son"],"firstnames":["Donghee"],"suffixes":[]},{"propositions":[],"lastnames":["Kang"],"firstnames":["Bongkoo"],"suffixes":[]}],"biburl":"https://www.bibsonomy.org/bibtex/2c929894b601b55a91d308ca16f5385f2/dblp","ee":"https://doi.org/10.1016/j.microrel.2018.07.056","interhash":"0879d6ab00f2b52d669950e123b7a26f","intrahash":"c929894b601b55a91d308ca16f5385f2","journal":"Microelectronics Reliability","keywords":"dblp","pages":"191-195","timestamp":"2019-01-08T11:37:57.000+0100","title":"Method to extract parameters of power law for nano-scale SiON pMOSFETs under negative bias temperature instability.","url":"http://dblp.uni-trier.de/db/journals/mr/mr88.html#YunKSSK18","volume":"88-90","year":"2018","bibtex":"@article{journals/mr/YunKSSK18,\n added-at = {2019-01-07T00:00:00.000+0100},\n author = {Yun, Yeohyeok and Kim, Gang-Jun and Seo, Ji-Hoon and Son, Donghee and Kang, Bongkoo},\n biburl = {https://www.bibsonomy.org/bibtex/2c929894b601b55a91d308ca16f5385f2/dblp},\n ee = {https://doi.org/10.1016/j.microrel.2018.07.056},\n interhash = {0879d6ab00f2b52d669950e123b7a26f},\n intrahash = {c929894b601b55a91d308ca16f5385f2},\n journal = {Microelectronics Reliability},\n keywords = {dblp},\n pages = {191-195},\n timestamp = {2019-01-08T11:37:57.000+0100},\n title = {Method to extract parameters of power law for nano-scale SiON pMOSFETs under negative bias temperature instability.},\n url = {http://dblp.uni-trier.de/db/journals/mr/mr88.html#YunKSSK18},\n volume = {88-90},\n year = 2018\n}\n\n","author_short":["Yun, Y.","Kim, G.","Seo, J.","Son, D.","Kang, B."],"key":"journals/mr/YunKSSK18","id":"journals/mr/YunKSSK18","bibbaseid":"yun-kim-seo-son-kang-methodtoextractparametersofpowerlawfornanoscalesionpmosfetsundernegativebiastemperatureinstability-2018","role":"author","urls":{"Link":"https://doi.org/10.1016/j.microrel.2018.07.056","Paper":"http://dblp.uni-trier.de/db/journals/mr/mr88.html#YunKSSK18"},"keyword":["dblp"],"downloads":0},"search_terms":["method","extract","parameters","power","law","nano","scale","sion","pmosfets","under","negative","bias","temperature","instability","yun","kim","seo","son","kang"],"keywords":["dblp"],"authorIDs":[],"dataSources":["bboPFacHd3A4uT9fM"]}