Automatic Test Program Generation for Out-of-Order Superscalar Processors. Zhang, Y., Rezine, A., Eles, P., & Peng, Z. In Asian Test Symposium, pages 338-343, 2012. IEEE Computer Society.
Automatic Test Program Generation for Out-of-Order Superscalar Processors. [link]Link  Automatic Test Program Generation for Out-of-Order Superscalar Processors. [link]Paper  bibtex   
@inproceedings{conf/ats/ZhangREP12,
  added-at = {2016-01-13T00:00:00.000+0100},
  author = {Zhang, Ying and Rezine, Ahmed and Eles, Petru and Peng, Zebo},
  biburl = {http://www.bibsonomy.org/bibtex/20d5594226a79f94ed8a94fb584489361/dblp},
  booktitle = {Asian Test Symposium},
  crossref = {conf/ats/2012},
  ee = {http://doi.ieeecomputersociety.org/10.1109/ATS.2012.43},
  interhash = {775af7388a59999dc9da033e8034968b},
  intrahash = {0d5594226a79f94ed8a94fb584489361},
  isbn = {978-1-4673-4555-2},
  keywords = {dblp},
  pages = {338-343},
  publisher = {IEEE Computer Society},
  timestamp = {2016-01-15T11:37:46.000+0100},
  title = {Automatic Test Program Generation for Out-of-Order Superscalar Processors.},
  url = {http://dblp.uni-trier.de/db/conf/ats/ats2012.html#ZhangREP12},
  year = 2012
}

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