{"_id":"uHQjsooBnrefCJf6m","bibbaseid":"zick--french-highprecisionselfcharacterizationforthelutburnininformationleakagethreat-2014","author_short":["Zick, K. M.","","French, M."],"bibdata":{"bibtype":"inproceedings","type":"inproceedings","author":[{"firstnames":["K.","M."],"propositions":[],"lastnames":["Zick"],"suffixes":[]},{"firstnames":[],"propositions":[],"lastnames":[""],"suffixes":[]},{"firstnames":["M."],"propositions":[],"lastnames":["French"],"suffixes":[]}],"booktitle":"2014 24th International Conference on Field Programmable Logic and Applications (FPL)","title":"High-precision self-characterization for the LUT burn-in information leakage threat","year":"2014","volume":"","number":"","pages":"1-6","keywords":"field programmable gate arrays;table lookup;self-characterization;LUT burn-in information leakage threat;FPGA transistors;clock sweeping;launch-and-capture data;Xilinx Kintex-7 paths;FPGA LUT contents;Delays;Field programmable gate arrays;Clocks;Table lookup;Transistors;Temperature measurement;Temperature sensors;Wear out;aging;self-characterization;data burn-in;data imprinting;FPGA;information leakage","doi":"10.1109/FPL.2014.6927475","issn":"1946-147X","month":"Sep.","bibtex":"@INPROCEEDINGS{6927475,\r\nauthor={K. M. {Zick} and and M. {French}},\r\nbooktitle={2014 24th International Conference on Field Programmable Logic and Applications (FPL)},\r\ntitle={High-precision self-characterization for the LUT burn-in information leakage threat},\r\nyear={2014},\r\nvolume={},\r\nnumber={},\r\npages={1-6},\r\nkeywords={field programmable gate arrays;table lookup;self-characterization;LUT burn-in information leakage threat;FPGA transistors;clock sweeping;launch-and-capture data;Xilinx Kintex-7 paths;FPGA LUT contents;Delays;Field programmable gate arrays;Clocks;Table lookup;Transistors;Temperature measurement;Temperature sensors;Wear out;aging;self-characterization;data burn-in;data imprinting;FPGA;information leakage},\r\ndoi={10.1109/FPL.2014.6927475},\r\nISSN={1946-147X},\r\nmonth={Sep.},}\r\n\r\n","author_short":["Zick, K. M.","","French, M."],"bibbaseid":"zick--french-highprecisionselfcharacterizationforthelutburnininformationleakagethreat-2014","role":"author","urls":{},"keyword":["field programmable gate arrays;table lookup;self-characterization;LUT burn-in information leakage threat;FPGA transistors;clock sweeping;launch-and-capture data;Xilinx Kintex-7 paths;FPGA LUT contents;Delays;Field programmable gate arrays;Clocks;Table lookup;Transistors;Temperature measurement;Temperature sensors;Wear out;aging;self-characterization;data burn-in;data imprinting;FPGA;information leakage"],"metadata":{"authorlinks":{}}},"bibtype":"inproceedings","biburl":"https://bibbase.org/f/bmA9t7uWu4mwHxyNf/mfrench-2023.bib","dataSources":["DH5xSA698cECsKng9","iTGGPbkxPJCvmCa3T","xdzEqXoYhRJckM7XG"],"keywords":["field programmable gate arrays;table lookup;self-characterization;lut burn-in information leakage threat;fpga transistors;clock sweeping;launch-and-capture data;xilinx kintex-7 paths;fpga lut contents;delays;field programmable gate arrays;clocks;table lookup;transistors;temperature measurement;temperature sensors;wear out;aging;self-characterization;data burn-in;data imprinting;fpga;information leakage"],"search_terms":["high","precision","self","characterization","lut","burn","information","leakage","threat","zick","","french"],"title":"High-precision self-characterization for the LUT burn-in information leakage threat","year":2014}