Integrating testability with design space exploration. Zwolinski, M. & Gaur, M. S. Microelectron. Reliab., 43(5):685–693, 2003.
Integrating testability with design space exploration [link]Paper  doi  bibtex   3 downloads  
@article{DBLP:journals/mr/ZwolinskiG03,
  author       = {Mark Zwolinski and
                  Manoj Singh Gaur},
  title        = {Integrating testability with design space exploration},
  journal      = {Microelectron. Reliab.},
  volume       = {43},
  number       = {5},
  pages        = {685--693},
  year         = {2003},
  url          = {https://doi.org/10.1016/S0026-2714(03)00034-9},
  doi          = {10.1016/S0026-2714(03)00034-9},
  timestamp    = {Mon, 15 Jun 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/ZwolinskiG03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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